afnor

CTP


Honeywell

IGT

Konica

Lorentzen

Metso

Noviprofibre

Xrite


 

 

 

 

 

 

 















 
Journée technique 1 - Mardi 24 mai

Dans le cadre de la semaine ISO TC 6 qui se déroulera à Paris du 22 au 29 mai 2011, l'ATIP vous invite
à la journée – atelier avec les acteurs mondiaux de la Métrologie et de la Normalisation Papiers et Cartons


   
8h – 8h 15   Accueil des participants - Ouverture
 

Convenor :          Luc LANAT
Member of ISO/TC6 and TC130 Graphic Technology, ATIP, President



9h00
 
Introduction
 

Aim of workshop and discussions
Luc LANAT, President, ATIP - Ulf SOHLIN, Chairman, ISO/TC6/SC2

What is ISO TC 6 and what are our rules and targets ?
Byron JORDAN, Chairman, ISO/TC 6

 


9h 15 
 
Users' perspectives
 

Mill practical view point
Ralf HAURY, Manager production lines, quality, technical services. Papierfabrik
Scheufelen, Germany.


11h 00 – 12h15

 

Automatic off-line suppliers presentations - Part 1

 

Automated paper testing L&W Autoline
Thomas FÜRST, Kent MANNILA, LORENTZEN & WETTRE, Sweden and
L&W Delegation : Edward WALLIS, France, Petteri MAIJANEN, Finland

Automatic off-line paper testing with Metso Paper Lab
Bogdan PAVLOVIC, Product Manager, Analyzers and Consistency, Process
Automation Systems, METSO AUTOMATION Inc, Finland


11h15

 

Automatic off-line suppliers presentations - Part 2

 

Technidyne
Todd POPSON, CEO & President, Technidyne Corporation, USA.

PTA-Line paper testing Automatic line
PTI/FRANK – NOVIPROFIBRE, presenter to be announced



11h45  
 

Link between off-line and on-line gauges . Suppliers views

 

Bogdan PAVLOVIC, Product Manager, Analyzers and Consistency, METSO
Automation Systems, Finland

Tarja SHAKESPEARE, PhD Principal Scientist Sensor Technology Center
HONEYWELL AUTOMATION and Control Solutions, Finland

 



12h15

 

Optics specifics, on-line, off-line

 

X-Rite views
Gerhard ROESLER,General Manager X-Rite On-Line Color Solutions
GRETAGMACBETH, Germany

Konica Minolta views and equipments
Noriaki MATSUBARA, Corporate Planning Division, KONICA MINOLTA
Sensing, Japan


  14h00
 
Working groups to review the following questions
 

 

  • How to calibrate automatic off-line gauges and different modulus like tear, tensile, roughness to ensure reproducibility?
  • What is the link of PM gauges and automatic labs with SI calibration references?
  • How different are off-line automatic testing eg PaperLab and Autoline as an example in comparison with current ISO standards? Is it realistic to have them in the same standard?
  • How to deal with conditioning of paper board and laboratory sheets?
  • How to deal with issues concerning optics calibration off-line/on-line?
– 18h00h17h30– 18h0030– 1
  14h00
 
Working groups debriefing and final roundtable
  16h30- 17h00
 
Summary and perspectives

 

 

IGT Honeywell2Konica2 Metso Noviprofibre2 X Rite

 


   

Informations complémentaires :
Contact :
Virginie BATAIS : 33 (0)1 45 62 11 91
atip@wanadoo.fr